ficonTEC offers a range of modular systems for the testing and characterization of photonic and optoelectronic devices, modules or subsystems. One highlight of this product line is the fully automated visual device inspection. Typical applications are the testing of un-mounted and mounted laser diodes (single chips or bars, low or high power), PDs, VCSELs etc. The systems offer semi-automated or fully automated LIV, spectral and far field measurements depending on the device type.
The TL500 is a tabletop test system for unmounted laser diode bars. The devices must be loaded manually onto the system's temperature-controlled vacuum chucks. The system then moves the temperature chucks into the enclosed test area where the devices are automatically aligned towards the probe needles by means of computer vision. The system now starts the test sequences according to the predefined test plan. The system can be configured to perform measurements on the complete bar at once or on each individual emitter on the bar. Typical measurements are LIV, spectrum and far field at a temperature range of 15°C to 80°C. All measurement results are stored in an SQL Database. |
The ficonTEC TL1000 offers the same test, measurement and data recording capabilities as the TL500 but adds automated handling (pick & place) of the devices for unassisted operation. Devices can be supplied on BlueTape, GelPaks or customized trays from which they will be picked and to which they will be placed after the test and measurements. The open software structure enables users to run their own extensive data evaluation.
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Like the TL1000, the TL2000 works without operator assistance once the BlueTape, GelPaks and/or custom trays with devices are placed into the system. An additional feature of the TL2000 is it ability to be equipped with a fully automated visual device inspection. Inspection of the P-side, N-side and the facets is available. |