Opto-electronic Chip Tester


Opto-electronics Chip Tester

ficonTEC’s series of testing machines is focused on automated electro-optical characterization of semiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmounted laser diode bars, single chips and chips on submounts.

The system can be configured to perform measurements on the complete bar at once or on each individual emitter of the bar. Typical measurements are LIV tests, spectral characterization, and examination of the far field distribution.

Fields of Use

  • Electro-optical characterization of unmounted laser diode bars
  • Characterization of VCSEL
  • Characterization of bare single chips
  • Test of photodiode bars
  • Test of chip on submount (COS)
  • Full test of high power laser diode bars (Full Bar Test)

Key Features

  • LIV, spectral and far & near field tests
  • Fully automatic handling of devices
  • Easy to change probe head
  • Option for component top side and facet inspection
  • Flexible integration of external test algorithms and test systems
  • Compatible to SQL and other database systems for data traceability

ProcessControlMaster software

All ficonTEC machines are shipped as turn-key systems. Beside the motion system the packages include the control unit consisting of motion controllers, motion amplifiers and a ready to use programming and control interface. The ProcessControlMaster software features an intuitive line based programming GUI including powerful alignment routines and is completely equipped for full assembly or testing automation. The ProcessControlMaster software is the software which also operates our assembly and testing machines.

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