This new optical test cell directly docks with the ATE at a core software and hardware level, enabling DC and high-data-rate test capability on the top side and precision optical six-axis active alignment probing below. It also accommodates automatic wafer loading and incorporates a patented vacuum thermal control chuck assembly, in-situ fiber array calibration, end-face inspection, high-speed probe calibration, and automated PIC mapping.
Find out more about the functionality and compatibility in the press release.