{"id":99,"date":"2017-11-16T09:30:29","date_gmt":"2017-11-16T08:30:29","guid":{"rendered":"http:\/\/wp10602123.server-he.de\/ficonworld\/?page_id=99"},"modified":"2019-04-26T10:03:43","modified_gmt":"2019-04-26T08:03:43","slug":"liv","status":"publish","type":"page","link":"https:\/\/www.ficontec.com\/cn\/liv\/","title":{"rendered":"LIV &#038; Chip testing"},"content":{"rendered":"[blank_spacer height=&#8221;30px&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;3\/4&#8243; el_position=&#8221;first last&#8221;]\n<h2 class=\"entry-title\">Laser characterization &amp; chip testing<\/h2>\n[\/spb_text_block] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;2\/3&#8243; el_position=&#8221;first&#8221;]\n<p>An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or Laser IV curve. By applying current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element as a function of increasing current. The resulting LIV curve reveals important clues as to the quality of manufacture and the performance of the laser diode, enabling a pass\/fail decision to be met.<\/p>\n<p>To test if all functional components are meeting specifications, they can be tested with an automatic test system from ficonTEC\u2019s test line. The characteristic laser parameters are measured by running an LIV or a DC sweep. Parallel to the optical power, the optical output spectrum and near and far-field characteristics can also be measured.<\/p>\n<p>The accumulated data is written to a SQL Database, providing the user with the necessary statistical analysis and feedback so that e.g. yield can be improved. The systems allow full component tracking and sorting when equipped with a handling system.<\/p>\n[\/spb_text_block] [spb_single_image image=&#8221;863&#8243; image_size=&#8221;full&#8221; frame=&#8221;noframe&#8221; intro_animation=&#8221;none&#8221; full_width=&#8221;no&#8221; lightbox=&#8221;no&#8221; link_target=&#8221;_self&#8221; width=&#8221;1\/3&#8243; el_position=&#8221;last&#8221;] [\/spb_column] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_single_image image=&#8221;864&#8243; image_size=&#8221;full&#8221; frame=&#8221;noframe&#8221; intro_animation=&#8221;none&#8221; full_width=&#8221;no&#8221; lightbox=&#8221;no&#8221; link_target=&#8221;_self&#8221; width=&#8221;1\/3&#8243; el_position=&#8221;first&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;1\/2&#8243; el_position=&#8221;last&#8221;]\n<h3 class=\"entry-title\">Key capabilities<\/h3>\n<ul>\n<li>\n<h4>Pick-&amp;-place of high-power laser diodes<\/h4>\n<\/li>\n<li>\n<h4>Single chip, or parallel testing of entire bars<\/h4>\n<\/li>\n<li>\n<h4>Optical beam characteristics can be measured in parallel with optical power<\/h4>\n<\/li>\n<li>\n<h4>All acquired and statistical data written to SQL file automatically<\/h4>\n<\/li>\n<\/ul>\n[\/spb_text_block] [\/spb_column] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;]\n<h3 class=\"entry-title\" style=\"text-align: center;\">Key features<\/h3>\n<h4 style=\"text-align: center;\">Vacuum pick-up tool handling<\/h4>\n<h4 style=\"text-align: center;\">LIV, spectral and far &amp; near field tests<\/h4>\n<h4 style=\"text-align: center;\">Fully automatic handling of devices<\/h4>\n<h4 style=\"text-align: center;\">Easy to change probe head<\/h4>\n<h4 style=\"text-align: center;\">Option for component top side and facet inspection<\/h4>\n<h4 style=\"text-align: center;\">Flexible integration of external test algorithms and test systems<\/h4>\n<h4 style=\"text-align: center;\">Compatible to SQL and other database systems for data traceability<\/h4>\n[\/spb_text_block] [blank_spacer height=&#8221;30px&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;]\n<h3 style=\"text-align: center;\">More information<\/h3>\n<h4 style=\"text-align: center;\">Relevant machine platforms and associated modules and technologies:<\/h4>\n<p style=\"text-align: center;\">Chip testing :\u00a0 TL2000<\/p>\n<p>&nbsp;<\/p>\n[\/spb_text_block] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;]\n<p style=\"text-align: center;\"><a class=\"sf-button large accent standard \" href=\"https:\/\/www.ficontec.com\/wp-content\/uploads\/pdf\/TestLine-TL2000-1603en.pdf\" target=\"_blank\"><span class=\"text\">Download pdf<\/span><\/a><\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n[\/spb_text_block] [\/spb_column]<\/p>\n","protected":false},"excerpt":{"rendered":"<p>[blank_spacer height=&#8221;30px&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;3\/4&#8243; el_position=&#8221;first last&#8221;] Laser characterization &amp; chip testing [\/spb_text_block] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;2\/3&#8243; el_position=&#8221;first&#8221;] An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or Laser IV curve. By applying current to the laser diode so it that emits light, the [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":1,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-99","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.6 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>LIV &amp; Chip testing - ficonTEC<\/title>\n<meta name=\"robots\" content=\"noindex, follow\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"LIV &amp; Chip testing - ficonTEC\" \/>\n<meta property=\"og:description\" content=\"[blank_spacer height=&#8221;30px&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;3\/4&#8243; el_position=&#8221;first last&#8221;] Laser characterization &amp; chip testing [\/spb_text_block] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;2\/3&#8243; el_position=&#8221;first&#8221;] An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or Laser IV curve. By applying current to the laser diode so it that emits light, the [&hellip;]\" \/>\n<meta property=\"og:url\" content=\"https:\/\/www.ficontec.com\/liv\/\" \/>\n<meta property=\"og:site_name\" content=\"ficonTEC\" \/>\n<meta property=\"article:modified_time\" content=\"2019-04-26T08:03:43+00:00\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<meta name=\"twitter:site\" content=\"@ficontec\" \/>\n<meta name=\"twitter:label1\" content=\"Est. reading time\" \/>\n\t<meta name=\"twitter:data1\" content=\"3 minutes\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\\\/\\\/schema.org\",\"@graph\":[{\"@type\":\"WebPage\",\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/liv\\\/\",\"url\":\"https:\\\/\\\/www.ficontec.com\\\/liv\\\/\",\"name\":\"LIV & Chip testing - ficonTEC\",\"isPartOf\":{\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#website\"},\"datePublished\":\"2017-11-16T08:30:29+00:00\",\"dateModified\":\"2019-04-26T08:03:43+00:00\",\"breadcrumb\":{\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/liv\\\/#breadcrumb\"},\"inLanguage\":\"zn-CN\",\"potentialAction\":[{\"@type\":\"ReadAction\",\"target\":[\"https:\\\/\\\/www.ficontec.com\\\/liv\\\/\"]}]},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/liv\\\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Startseite\",\"item\":\"https:\\\/\\\/www.ficontec.com\\\/cn\\\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"LIV &#038; Chip testing\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#website\",\"url\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/\",\"name\":\"ficonTEC\",\"description\":\"photonics assembly &amp; testing\",\"publisher\":{\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#organization\"},\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"zn-CN\"},{\"@type\":\"Organization\",\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#organization\",\"name\":\"ficonTEC Service GmbH\",\"url\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/\",\"logo\":{\"@type\":\"ImageObject\",\"inLanguage\":\"zn-CN\",\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#\\\/schema\\\/logo\\\/image\\\/\",\"url\":\"https:\\\/\\\/www.ficontec.com\\\/wp-content\\\/uploads\\\/2018\\\/01\\\/logo-last.jpg\",\"contentUrl\":\"https:\\\/\\\/www.ficontec.com\\\/wp-content\\\/uploads\\\/2018\\\/01\\\/logo-last.jpg\",\"width\":1170,\"height\":650,\"caption\":\"ficonTEC Service GmbH\"},\"image\":{\"@id\":\"https:\\\/\\\/www.ficontec.com\\\/jp\\\/#\\\/schema\\\/logo\\\/image\\\/\"},\"sameAs\":[\"https:\\\/\\\/x.com\\\/ficontec\",\"https:\\\/\\\/www.linkedin.com\\\/company\\\/ficontec\\\/\"]}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"LIV & Chip testing - ficonTEC","robots":{"index":"noindex","follow":"follow"},"og_locale":"en_US","og_type":"article","og_title":"LIV & Chip testing - ficonTEC","og_description":"[blank_spacer height=&#8221;30px&#8221; width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_column width=&#8221;1\/1&#8243; el_position=&#8221;first last&#8221;] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;3\/4&#8243; el_position=&#8221;first last&#8221;] Laser characterization &amp; chip testing [\/spb_text_block] [spb_text_block pb_margin_bottom=&#8221;no&#8221; pb_border_bottom=&#8221;no&#8221; width=&#8221;2\/3&#8243; el_position=&#8221;first&#8221;] An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or Laser IV curve. By applying current to the laser diode so it that emits light, the [&hellip;]","og_url":"https:\/\/www.ficontec.com\/liv\/","og_site_name":"ficonTEC","article_modified_time":"2019-04-26T08:03:43+00:00","twitter_card":"summary_large_image","twitter_site":"@ficontec","twitter_misc":{"Est. reading time":"3 minutes"},"schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"WebPage","@id":"https:\/\/www.ficontec.com\/liv\/","url":"https:\/\/www.ficontec.com\/liv\/","name":"LIV & Chip testing - ficonTEC","isPartOf":{"@id":"https:\/\/www.ficontec.com\/jp\/#website"},"datePublished":"2017-11-16T08:30:29+00:00","dateModified":"2019-04-26T08:03:43+00:00","breadcrumb":{"@id":"https:\/\/www.ficontec.com\/liv\/#breadcrumb"},"inLanguage":"zn-CN","potentialAction":[{"@type":"ReadAction","target":["https:\/\/www.ficontec.com\/liv\/"]}]},{"@type":"BreadcrumbList","@id":"https:\/\/www.ficontec.com\/liv\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Startseite","item":"https:\/\/www.ficontec.com\/cn\/"},{"@type":"ListItem","position":2,"name":"LIV &#038; Chip testing"}]},{"@type":"WebSite","@id":"https:\/\/www.ficontec.com\/jp\/#website","url":"https:\/\/www.ficontec.com\/jp\/","name":"ficonTEC","description":"photonics assembly &amp; testing","publisher":{"@id":"https:\/\/www.ficontec.com\/jp\/#organization"},"potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/www.ficontec.com\/jp\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"zn-CN"},{"@type":"Organization","@id":"https:\/\/www.ficontec.com\/jp\/#organization","name":"ficonTEC Service GmbH","url":"https:\/\/www.ficontec.com\/jp\/","logo":{"@type":"ImageObject","inLanguage":"zn-CN","@id":"https:\/\/www.ficontec.com\/jp\/#\/schema\/logo\/image\/","url":"https:\/\/www.ficontec.com\/wp-content\/uploads\/2018\/01\/logo-last.jpg","contentUrl":"https:\/\/www.ficontec.com\/wp-content\/uploads\/2018\/01\/logo-last.jpg","width":1170,"height":650,"caption":"ficonTEC Service GmbH"},"image":{"@id":"https:\/\/www.ficontec.com\/jp\/#\/schema\/logo\/image\/"},"sameAs":["https:\/\/x.com\/ficontec","https:\/\/www.linkedin.com\/company\/ficontec\/"]}]}},"_links":{"self":[{"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/pages\/99","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/comments?post=99"}],"version-history":[{"count":21,"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/pages\/99\/revisions"}],"predecessor-version":[{"id":4499,"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/pages\/99\/revisions\/4499"}],"wp:attachment":[{"href":"https:\/\/www.ficontec.com\/cn\/wp-json\/wp\/v2\/media?parent=99"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}