Automated Optical Inspection (AOI)
Facet inspection as well as contamination and defect recognition – fast, automated and reliable
No complex assembly process is complete without the ability to inspect and characterize the many different components used. ficonTEC’s fully automated INSPECTIONLINE systems acquire high-resolution pictures of the surfaces of interest and performs optical inspection based on the user’s criteria. For example, facet inspection of laser diodes, QC for coatings, surface inspection, top/bottom/side-wall inspection of semiconductor chips, and die sorting are just some of the many inspection tasks performed routinely by ficonTEC’s suite of inspection tools.
As for all of ficonTEC’s systems, a modular approach permits the inspection platform to equipped with additional features – automatic tray handling and various feeding philosophies, testing capabilities (e.g. LIV), top/bottom chip inspection, and in-situ labelling.
Our defect recognition algorithms now use Deep Learning – see the video.Watch now
High-magnification imaging system
Color camera for individual color channel examination
Chip side wall inspection
Prognosis of crack propagation
Dust and fiber recognition
Detailed component/batch/lot tracking
Individual error catalog handling