Photonic Device Testing
Testing and characterizing photonic devices
to suit the needs of the application
ficonTEC’s series of photonic device testing machines is focused on automated optical and electrical characterization of opto-electronic chips and assembles. These increasingly complex and miniaturized photonic devices and integrated circuits (PICs) perform advanced optical functions, such as routing, (de)multiplexing switching of optical signals, sensing and data communications. These devices include silicon photonics components, sensor assemblies, medical devices, MEMS/MOEMS, miniature lasers, hybrid assemblies, LED print heads, high-power LEDs, and many more.
The system checks to see if full opto-electronic functionality is meeting specifications. The accumulated data is written to an SQL database, providing the user with the necessary statistical analysis and feedback so that, for example, yield can be tracked and improved. The system allows full component tracking and sorting when equipped with a handling system.
The latest integrated designs, which incorporate both electronic and photonic devices on a hybrid device, provide benefit in terms of functionality, miniaturization, high-volume manufacture and cost/part. Furthermore, the long-term trend towards the uptake of PICs is a key driver for future manufacturing.
However, these high-volume manufactured devices also present a number of challenges during device testing. The long-term requirement will be for ever higher levels of automation and highly parallel, mixed-signal electro-optical testing concepts, both on and off-wafer – a goal to which ficonTEC is already working toward.
Testing of singulated devices
Testing of fully packaged devices
Combined optical & electrical testing
Interfacing to test & measurement equipment
Vacuum pick-up tool handling
LIV, spectral and far & near-field tests
Easy-to-change optical & electrical probe heads
Die sorting and component tracking
Process parameter tracking
OCR for serial number tracking & component traceability
Flexible integration of external instrumentation and test protocols
Compatible to SQL and other database systems for data traceability