Mixed-signal electro-optical measurement instrumentation for integrated photonics

September 2023

Mixed-signal electro-optical measurement instrumentation for integrated photonics

ficonTEC and Quantifi Photonics (Auckland, New Zealand) entered into a collaborative partnership several years ago (2019) in order to advance electro-optical measurement capability for use in volume testing within the manufacturing cycle of integrated photonic devices. According to CEO Torsten Vahrenkamp at the time:
“The collaboration with Quantifi Photonics could not come at a better time, as a number of our current activities are geared to further improving performance and capability for our new, next-generation assembly and test systems. By integrating Quantifi Photonics’ innovative optical instrumentation and software into our modular machine architecture and process control software, respectively, we take a significant step forward in our continued and growing support for integrated photonics developments worldwide.”

ficonTEC WLT Demo-Unit

As optical and electrical technologies become more miniaturized, complex, and increasingly integrated with one another’s underlying architecture, the more inefficient and frustrating it is for process engineers to implement separate electrical and optical test and qualification procedures. To avoid this, engineers need fully automated systems that can perform complex precision alignment and assembly, as well as combined electro-optical I/O measurements for complex integrated photonic devices – from singulated dies, through to wafer-level and even up to fully packaged devices.

The good news is that the two organizations still continue to this day to work to support one another. Those with a keen eye may have seen Quantifi Photonics demos on the ficonTEC booth at 2023 events.

This collaboration is due to move up a gear in the coming months (2024), with continued mutual support at major events, for example at Photonics West and OFC in early 2024. In addition, there are long-term plans to better present the capabilities of the combined product portfolio both online and off.
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September 29, 2021 – Freely viewable

PIC Testing with Wafer-level Test Systems

With an ever increasing number of wafer-level test systems spread across production, delivery, installation and being operational, some customers are already gaining useful insights into its application. With the first Season 3 webinar, Iñigo Artundo and now Prof. Andrea Melloni of Politecnico di Milano join Torsten Vahrenkamp for an in-depth view of VLC Photonics’ own approach to the utilization and potential of this tool.